Advantest announces NAND flash test solutions

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Advantest Corp on Tuesday announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and the HA5100CELL, based on the Harmonic architecture, for wafer test. Together, the tools offer total test support for high-capacity, high-speed next-generation NAND flash memory devices, from the front end to the back end.

With the increasing popularity of smartphones, multifunctional portable devices, and SSDs, demand for NAND flash memory has skyrocketed: the global NAND market is set to grow 18% in 2011, according to market research firm IHS iSuppli.

Moreover, NAND flash device capacity and speed is also increasing. Average data transmission speeds have climbed ten-fold to 400Mbps. These technological innovations, together with the proliferation of end-product markets, are driving explosive bit growth and production volume increases, and reinforcing a trend towards longer device test times.

With device speeds expected to increase further, NAND manufacturers require a test system that lowers test costs while offering an operating frequency range that can support ONFI3 interfaces. Advantest’s next-generation NAND flash memory test solutions meet these needs with groundbreaking technology that delivers unprecedented test time and test cost reductions.