Advantest announces NAND flash test solutions

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Advantest Corp on Tuesday announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and the HA5100CELL, based on the Harmonic architecture, for wafer test. Together, the tools offer total test support for high-capacity, high-speed next-generation NAND flash memory devices, from the front end to the back end.

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With the increasing popularity of smartphones, multifunctional portable devices, and SSDs, demand for NAND flash memory has skyrocketed: the global NAND market is set to grow 18% in 2011, according to market research firm IHS iSuppli.

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Moreover, NAND flash device capacity and speed is also increasing. Average data transmission speeds have climbed ten-fold to 400Mbps. These technological innovations, together with the proliferation of end-product markets, are driving explosive bit growth and production volume increases, and reinforcing a trend towards longer device test times.

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With device speeds expected to increase further, NAND manufacturers require a test system that lowers test costs while offering an operating frequency range that can support ONFI3 interfaces. Advantest’s next-generation NAND flash memory test solutions meet these needs with groundbreaking technology that delivers unprecedented test time and test cost reductions.

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